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  ? integrated circuits group LH28F640BNHG-PTSL70 flash memory 64m (4m 16) (model no.: lhf64n14) spec no.: fm02y002 issue date: november 5, 2002 p relimina r y p roduc t s pecific a tions

lhf64n14 ? handle this document carefully for it contains material protected by international copyright law. any reproduction, full or in part, of this material is prohibited without the express written permission of the company. ? when using the products covered herein, please observe the conditions written herein and the precautions outlined in the following paragraphs. in no event shall the company be liable for any damages resulting from failure to strictly adhere to these conditions and precautions. (1) the products covered herein are designed and manufactured for the following application areas. when using the products covered herein for the equipment listed in paragraph (2), even for the following application areas, be sure to observe the precautions given in paragraph (2). never use the products for the equipment listed in paragraph (3). ? office electronics ? instrumentation and measuring equipment ? machine tools ? audiovisual equipment ? home appliance ? communication equipment other than for trunk lines (2) those contemplating using the products covered herein for the following equipment which demands high reliability , should first contact a sales representative of the company and then accept responsibility for incorporating into the design fail-safe operation, redundancy, and other appropriate measures for ensuring reliability and safety of the equipment and the overall system. ? control and safety devices for airplanes, trains, automobiles, and other transportation equipment ? mainframe computers ? traffic control systems ? gas leak detectors and automatic cutoff devices ? rescue and security equipment ? other safety devices and safety equipment, etc. (3) do not use the products covered herein for the following equipment which demands extremely high performance in terms of functionality, reliability, or accuracy. ? aerospace equipment ? communications equipment for trunk lines ? control equipment for the nuclear power industry ? medical equipment related to life support, etc. (4) please direct all queries and comments regarding the interpretation of the above three paragraphs to a sales representative of the company. ? please direct all queries regarding the products covered herein to a sales representative of the company. rev. 0.11 sharp
lhf64n14 1 page 0.75mm pitch 56-ball csp pinout ............................. 3 pin descriptions.......................................................... 4 simultaneous operation modes allowed with four planes .................................. 6 memory map .............................................................. 7 identifier codes and otp address for read operation ............................................. 8 identifier codes and otp address for read operation on partition configuration........ 8 otp block address map for otp program............... 9 bus operation........................................................... 10 command definitions ............................................... 11 functions of block lock and block lock-down..... 13 block locking state transitions upon command write................................................ 13 block locking state transitions upon wp# transition................................................. 14 status register definition......................................... 15 extended status register definition ........................ 16 read configuration register definition................... 17 page frequency configuration settings ............................ 18 frequency configuration .......................................... 18 output configuration ................................................ 19 read sequence and burst length ............................. 19 partition configuration register definition.............. 20 partition configuration ............................................. 20 1 electrical specifications......................................... 21 1.1 absolute maximum ratings ........................... 21 1.2 operating conditions ...................................... 21 1.2.1 capacitance .............................................. 22 1.2.2 ac input/output test conditions ............ 22 1.2.3 dc characteristics ................................... 23 1.2.4 ac characteristics - read-only operations......................... 25 1.2.5 ac characteristics - write operations ................................. 33 1.2.6 reset operations ...................................... 35 1.2.7 block erase, advanced factory program, (page buffer) program and otp program performance............. 36 contents rev. 0.11 sharp
lhf64n14 2 LH28F640BNHG-PTSL70 64mbit (4mbit 16) synchronous dual work flash memory 64m density with 16bit i/o interface high performance reads ? 70/20ns 8-word page mode  66mhz synchronous burst mode configurative 4-plane dual work  flexible partitioning  read operations during block erase or (page buffer) program  status register for each partition low power operation  1.7v read and write operations  v ccq for input/output power supply isolation  automatic power savings mode reduces i ccr in static mode enhanced code + data storage  5 s typical erase/program suspends otp (one time program) block  4-word factory-programmed area  4-word user-programmable area high performance program with page buffer  16-word page buffer  5 s/word (typ.) at 12v v pp operating temperature -40 c to +85 c advanced factory programming mode  3.5 s/word (typ.) flexible blocking architecture  eight 4k-word parameter blocks  one-hundred and twenty-seven 32k-word main blocks  top parameter location enhanced data protection features  individual block lock and block lock-down with zero-latency  all blocks are locked at power-up or device reset.  absolute protection with v pp v pplk  block erase, advanced factory program, (page buffer) word program lockout during power transitions automated erase/program algorithms  1.8v low-power 22 s/word (typ.) programming  12v no glue logic 9 s/word (typ.) production programming and 0.5s erase (typ.) cross-compatible command support  basic command set  common flash interface (cfi) extended cycling capability  minimum 100,000 block erase cycles 0.75mm pitch 56-ball csp etox tm* flash technology not designed or rated as radiation hardened cmos process (p-type silicon substrate) the product, which is 4-plane synchronous dual work (simultaneous read while erase/program) flash memory, is a low power, high density, low cost, nonvolatile read/write storage solution for a wide range of applications. the product can operate at v cc =1.7v-1.95v and v pp =0.9v-1.95v or 11.7v-12.3v. its low voltage operation capability greatly extends battery life for portable applications. the product provides high performance asynchronous page mode and synchronous burst mode. it allows code execution directly from flash, thus eliminating time consuming wait states. furthermore, its newly configurative partitioning architecture allows flexible dual work operation. the memory array block architecture utilizes enhanced data protection features and provides separate parameter and main blocks that provide maximum flexibility for safe nonvolatile code and data storage. fast program capability is provided through the use of high speed page buffer program. special otp (one time program) block provides an area to store permanent code such as an unique number. * etox is a trademark of intel corporation. rev. 0.11 sharp
lhf64n14 3 a 11 a 12 a 9 a 8 gnd a 20 v cc clk rst# v pp a 18 a 17 a 5 a 6 a 4 h g f e d c b a a 3 a 13 a 15 a 14 a 10 a 21 wait adv# a 16 dq 12 we# a 19 wp# nc a 7 a 2 a 1 v ccq gnd dq 14 dq 15 dq 6 dq 13 dq 4 dq 11 dq 10 dq 2 dq 1 dq 9 dq 0 ce# a 0 oe# dq 7 12 3 4 56 7 gnd dq 5 v cc dq 3 v ccq dq 8 gnd 0.75mm pitch 56-ball csp pinout 11mm x 8mm top view figure 1. 0.75mm pitch 56-ball csp pinout rev. 0.11 sharp
lhf64n14 4 table 1. pin descriptions symbol type name and function a 0 -a 21 input address inputs: inputs for addresses. 64m: a 0 -a 21 dq 0 -dq 15 input/ output data inputs/outputs: inputs data and commands during cui (command user interface) write cycles, outputs data during memory array, status register, query code, identifier code and read/partition configuration register code reads. data pins float to high-impedance (high z) when the chip or outputs are deselected. data is internally latched during an erase or program cycle. ce# input chip enable: activates the device?s control logic, input buffers, decoders and sense amplifiers. ce#-high (v ih ) deselects the device and reduces power consumption to standby levels. clk input clock: synchronizes the memory to the system bus operating frequency in synchronous burst mode. the first rising (or falling if rcr.6 is "0") edge latches the address when adv# is v il or upon a rising adv# edge. this is used only for synchronous burst mode. adv# input address valid: addresses are input to the memory when adv# is low (v il ). addresses are latched on adv#?s rising edge during read and write operations. rst# input reset: when low (v il ), rst# resets internal automation and inhibits write operations which provides data protection. rst#-high (v ih ) enables normal operation. after power-up or reset mode, the device is automatically set to asynchronous read array mode. rst# must be low during power-up/down. oe# input output enable: gates the device?s outputs during a read cycle. we# input write enable: controls writes to the cui and array blocks. addresses and data are latched on the rising edge of ce# or we# (whichever goes high first). wp# input write protect: when wp# is v il , locked-down blocks cannot be unlocked. erase or program operation can be executed to the blocks which are not locked and not locked- down. when wp# is v ih , lock-down is disabled. wait output wait: indicates data valid in synchronous burst modes. the read configuration register bit 10 (rcr.10, wt) determines its polarity. with ce# at v il , wait?s active output is v ol or v oh . wait is high-z if ce# is v ih . wait is not gated by oe#. wait is used only for synchronous burst mode. v pp input monitoring power supply voltage: v pp is not used for power supply pin. with v pp v pplk , block erase, advanced factory program, (page buffer) program or otp program cannot be executed and should not be attempted. applying 12v0.3v to v pp provides fast erasing or fast programming mode. in this mode, v pp is power supply pin. applying 12v0.3v to v pp during erase/program can only be done for a maximum of 1,000 cycles on each block. v pp may be connected to 12v0.3v for a total of 80 hours maximum. use of this pin at 12v beyond these limits may reduce block cycling capability or cause permanent damage. rev. 0.11 sharp
lhf64n14 5 v cc supply device power supply (1.7v-1.95v): with v cc v lko , all write attempts to the flash memory are inhibited. device operations at invalid v cc voltage (see dc characteristics) produce spurious results and should not be attempted. v ccq supply input/output power supply (1.7v-1.95v): power supply for all input/output pins. gnd supply ground: do not float any ground pins. nc no connect: lead is not internally connected; it may be driven or floated. table 1. pin descriptions symbol type name and function rev. 0.11 (continued) sharp
lhf64n14 6 notes: 1. "x" denotes the operation available. 2. configurative partition dual work restrictions: status register reflects partition state, not wsm (write state machine) state - this allows a status register for each partition. only one partition can be erased or programmed at a time - no command queuing. commands must be written to an address within the block targeted by that command. it is not possible to do burst reads that cross partition boundaries. table 2. simultaneous operation modes allowed with four planes (1, 2) if one partition is: then the modes allowed in the other partition is: read array read id/otp read status read query word program page buffer program otp program block erase advanced factory program program suspend block erase suspend read arrayxxxx x x x x x read id/otpxxxx x x x x x read statusxxxx x x x x x x x read queryxxxx x x x x x word programxxxx x page buffer program xxxx x otp program x block erasexxxx advanced factory program x program suspend xxxx x block erase suspend xxxx x x x rev. 0.11 sharp
lhf64n14 7 127 128 129 130 131 132 133 4k-word 3ff000h - 3fffffh 4k-word 3fe000h - 3fefffh 4k-word 3fd000h - 3fdfffh 4k-word 3fc000h - 3fcfffh 4k-word 3fb000h - 3fbfffh 4k-word 3fa000h - 3fafffh 4k-word plane3 (parameter plane) 3f9000h - 3f9fffh 3f8000h - 3f8fffh plane2 (uniform plane) 0 1 2 3 4 5 12 13 14 15 32k-word 078000h - 07ffffh 32k-word 070000h - 077fffh 32k-word 068000h - 06ffffh 32k-word 060000h - 067fffh 32k-word 058000h - 05ffffh 32k-word 050000h - 057fffh 32k-word plane0 (uniform plane) 048000h - 04ffffh 32k-word 040000h - 047fffh 32k-word 038000h - 03ffffh 32k-word 030000h - 037fffh 32k-word 028000h - 02ffffh 32k-word 020000h - 027fffh 32k-word 018000h - 01ffffh 32k-word 010000h - 017fffh 32k-word 008000h - 00ffffh 32k-word 000000h - 007fffh 0f8000h - 0fffffh 0f0000h - 0f7fffh 0e8000h - 0effffh 0e0000h - 0e7fffh 0d8000h - 0dffffh 0d0000h - 0d7fffh plane1 (uniform plane) 0c8000h - 0cffffh 0c0000h - 0c7fffh 0b8000h - 0bffffh 0b0000h - 0b7fffh 0a8000h - 0affffh 0a0000h - 0a7fffh 098000h - 09ffffh 090000h - 097fffh 088000h - 08ffffh 080000h - 087fffh block number address range block number address range 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 16 18 19 20 21 22 23 17 24 25 6 8 9 10 11 7 26 28 29 30 31 27 62 63 32 33 34 35 42 43 44 45 32k-word 178000h - 17ffffh 32k-word 170000h - 177fffh 32k-word 168000h - 16ffffh 32k-word 160000h - 167fffh 32k-word 158000h - 15ffffh 32k-word 150000h - 157fffh 32k-word 148000h - 14ffffh 32k-word 140000h - 147fffh 32k-word 138000h - 13ffffh 32k-word 130000h - 137fffh 32k-word 128000h - 12ffffh 32k-word 120000h - 127fffh 32k-word 118000h - 11ffffh 32k-word 110000h - 117fffh 32k-word 108000h - 10ffffh 32k-word 100000h - 107fffh 1f8000h - 1fffffh 1f0000h - 1f7fffh 1e8000h - 1effffh 1e0000h - 1e7fffh 1d8000h - 1dffffh 1d0000h - 1d7fffh 1c8000h - 1cffffh 1c0000h - 1c7fffh 1b8000h - 1bffffh 1b0000h - 1b7fffh 1a8000h - 1affffh 1a0000h - 1a7fffh 198000h - 19ffffh 190000h - 197fffh 188000h - 18ffffh 180000h - 187fffh 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 46 48 49 50 51 52 53 47 54 55 36 38 39 40 41 37 56 58 59 60 61 57 92 93 94 95 64 65 72 73 74 75 32k-word 278000h - 27ffffh 32k-word 270000h - 277fffh 32k-word 268000h - 26ffffh 32k-word 260000h - 267fffh 32k-word 258000h - 25ffffh 32k-word 250000h - 257fffh 32k-word 248000h - 24ffffh 32k-word 240000h - 247fffh 32k-word 238000h - 23ffffh 32k-word 230000h - 237fffh 32k-word 228000h - 22ffffh 32k-word 220000h - 227fffh 32k-word 218000h - 21ffffh 32k-word 210000h - 217fffh 32k-word 208000h - 20ffffh 32k-word 200000h - 207fffh 2f8000h - 2fffffh 2f0000h - 2f7fffh 2e8000h - 2effffh 2e0000h - 2e7fffh 2d8000h - 2dffffh 2d0000h - 2d7fffh 2c8000h - 2cffffh 2c0000h - 2c7fffh 2b8000h - 2bffffh 2b0000h - 2b7fffh 2a8000h - 2affffh 2a0000h - 2a7fffh 298000h - 29ffffh 290000h - 297fffh 288000h - 28ffffh 280000h - 287fffh 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 76 78 79 80 81 82 83 77 84 85 66 68 69 70 71 67 86 88 89 90 91 87 122 123 124 102 103 104 105 32k-word 378000h - 37ffffh 32k-word 370000h - 377fffh 32k-word 368000h - 36ffffh 32k-word 360000h - 367fffh 32k-word 358000h - 35ffffh 32k-word 350000h - 357fffh 32k-word 348000h - 34ffffh 32k-word 340000h - 347fffh 32k-word 338000h - 33ffffh 32k-word 330000h - 337fffh 32k-word 328000h - 32ffffh 32k-word 320000h - 327fffh 32k-word 318000h - 31ffffh 32k-word 310000h - 317fffh 32k-word 308000h - 30ffffh 32k-word 300000h - 307fffh 3f0000h - 3f7fffh 3e8000h - 3effffh 3e0000h - 3e7fffh 3d8000h - 3dffffh 3d0000h - 3d7fffh 3c8000h - 3cffffh 3c0000h - 3c7fffh 3b8000h - 3bffffh 3b0000h - 3b7fffh 3a8000h - 3affffh 3a0000h - 3a7fffh 398000h - 39ffffh 390000h - 397fffh 388000h - 38ffffh 380000h - 387fffh 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 32k-word 106 108 109 110 111 112 113 107 114 115 96 98 99 100 101 97 116 118 119 120 121 117 125 126 134 4k-word figure 2. memory map (top parameter) rev. 0.11 sharp
lhf64n14 8 notes: 1. the address a 21 -a 16 are shown in below table for reading the manufacturer code, device code, device configuration code and otp data. 2. top parameter device has its parameter blocks in the plane3 (the highest address). 3. block address = the beginning location of a block address within the partition to which the read identifier codes/otp command (90h) has been written. dq 15 -dq 2 are reserved for future implementation. 4. rcrc=read configuration register code. 5. pcrc=partition configuration register code. 6. otp-lk=otp block lock configuration. 7. otp=otp block data. notes: 1. the address to read the identifier codes or otp data is dependent on the partition which is selected when writing the read identifier codes/otp command (90h). 2. refer to table 15 for the partition configuration register. table 3. identifier codes and otp address for read operation code address [a 15 -a 0 ] data [dq 15 -dq 0 ] notes manufacturer code manufacturer code 0000h 00b0h 1 device code top parameter device code 0001h 00bah 1, 2 block lock configuration code block is unlocked block address + 2 dq 0 = 0 3 block is locked dq 0 = 1 3 block is not locked-down dq 1 = 0 3 block is locked-down dq 1 = 1 3 device configuration code read configuration register 0005h rcrc 1, 4 partition configuration register 0006h pcrc 1, 5 otp otp lock 0080h otp-lk 1, 6 otp 0081-0088h otp 1, 7 table 4. identifier codes and otp address for read operation on partition configuration (1) (64m-bit device) partition configuration register (2) address (64m-bit device) pcr.10 pcr.9 pcr.8 [a 21 -a 16 ] 00000h 0 0 1 00h or 10h 0 1 0 00h or 20h 1 0 0 00h or 30h 0 1 1 00h or 10h or 20h 1 1 0 00h or 20h or 30h 1 0 1 00h or 10h or 30h 1 1 1 00h or 10h or 20h or 30h rev. 0.11 sharp
lhf64n14 9 customer programmable area lock bit (dq 1 ) factory programmed area lock bit (dq 0 ) customer programmable area factory programmed area reserved for future implementation 000080h 000081h 000084h 000085h 000088h [a 21 -a 0 ] (dq 15 -dq 2) figure 3. otp block address map for otp program (the area outside 80h~88h cannot be used.) rev. 0.11 sharp
lhf64n14 10 notes: 1. refer to dc characteristics. when v pp v pplk , memory contents can be read, but cannot be altered. 2. x can be v il or v ih for control pins and addresses, and v pplk or v pph1/2 for v pp . see dc characteristics for v pplk and v pph1/2 voltages. 3. rst# at gnd0.2v ensures the lowest power consumption. 4. command writes involving block erase, (page buffer) program or otp program are reliably executed when v pp =v pph1/2 and v cc =1.7v-1.95v. command writes involving advanced factory program are reliably executed when v pp =v pph2 and v cc =1.7v-1.95v. 5. refer to table 6 for valid d in during a write operation. 6. never hold oe# low and we# low at the same timing. 7. refer to appendix of lh28f640bn series for more information about query code. 8. wait indicates data valid in synchronous burst modes. wait is used only for synchronous burst mode. table 5. bus operation (1, 2) mode notes rst# ce# oe# we# adv# wp# address v pp dq 0-15 wa i t read arra;y 6 v ih v il v il v ih v il xxx d out see note 8 output disable v ih v il v ih v ih xxxxhigh zv il or v ih standby v ih v ih xxxx x xhigh zhigh z reset 3 v il xxxxx x xhigh zhigh z read identifier codes/otp 6 v ih v il v il v ih v il x see table 3 and table 4 x see table 3 and table 4 v il or v ih read query 6,7 v ih v il v il v ih v il x see appendix x see appendix v il or v ih write 4,5,6 v ih v il v ih v il v il xxxd in v il or v ih rev. 0.11 sharp
lhf64n14 11 notes: 1. bus operations are defined in table 5. 2. all addresses which are written at the first bus cycle should be the same as the addresses which are written at the second bus cycle. x=any valid address within the device. pa=address within the selected partition. ia=identifier codes address (see table 3 and table 4). qa=query codes address. refer to appendix of lh28f640bn series for details. ba=address within the block being erased, set/cleared block lock bit or set block lock-down bit. wa=address of memory location for the program command or the first address for the page buffer program command. wa0=first address for the advanced factory program command. oa=address of otp block to be read or programmed (see figure 3). rcrc=read configuration register code presented on the addresses a 0 -a 15 . pcrc=partition configuration register code presented on the address a 0 -a 15 . 3. id=data read from identifier codes. (see table 3 and table 4). qd=data read from query database. refer to appendix of lh28f640bn series for details. srd=data read from status register. see table 10 and table 11 for a description of the status register bits. wd=data to be programmed at location wa. data is latched on the rising edge of we# or ce# (whichever goes high first) during command write cycles. od=data within otp block. data is latched on the rising edge of we# or ce# (whichever goes high first) during command write cycles. n-1=n is the number of the words to be loaded into a page buffer. 4. following the read identifier codes/otp command, read operations access manufacturer code, device code, block lock configuration code, read configuration register code, partition configuration register code and the data within otp block (see table 3 and table 4). the read query command is available for reading cfi (common flash interface) information. table 6. command definitions (11) command bus cycles req?d notes first bus cycle second bus cycle oper (1) addr (2) data oper (1) addr (2) data (3) read array 1 write pa ffh read identifier codes/otp 2 4 write pa 90h read ia or oa id or od read query 24writepa 98hreadqa qd read status register 2 write pa 70h read pa srd clear status register 1 write pa 50h block erase 2 5 write ba 20h write ba d0h advanced factory program 2 5,9 write wa0 30h write wa0 d0h program 25,6writewa 40h or 10h write wa wd page buffer program 4 5,7 write wa e8h write wa n-1 block erase and (page buffer) program suspend 18,9writepa b0h block erase and (page buffer) program resume 18,9writepa d0h set block lock bit 2 write ba 60h write ba 01h clear block lock bit 2 10 write ba 60h write ba d0h set block lock-down bit 2 write ba 60h write ba 2fh otp program 2 9 write oa c0h write oa od set read configuration register 2 write rcrc 60h write rcrc 03h set partition configuration register 2 write pcrc 60h write pcrc 04h rev. 0.11 sharp
lhf64n14 12 5. block erase, advanced factory program or (page buffer) program cannot be executed when the selected block is locked. unlocked block can be erased or programmed when rst# is v ih . 6. either 40h or 10h are recognized by the cui (command user interface) as the program setup. 7. following the third bus cycle, input the program sequential address and write data of "n" times. finally, input the any valid address within the target block to be programmed and the confirm command (d0h). refer to appendix of lh28f640bn series for details. 8. if the program operation in one partition is suspended and the erase operation in other partition is also suspended, the suspended program operation should be resumed first, and then the suspended erase operation should be resumed next. 9. advanced factory program and otp program operations can not be suspended. the otp program command can not be accepted while the block erase operation is being suspended. 10. following the clear block lock bit command, block which is not locked-down is unlocked when wp# is v il . when wp# is v ih , lock-down bit is disabled and the selected block is unlocked regardless of lock-down configuration. 11. commands other than those shown above are reserved by sharp for future device implementations and should not be used. rev. 0.11 sharp
lhf64n14 13 notes: 1. dq 0 =1: a block is locked; dq 0 =0: a block is unlocked. dq 1 =1: a block is locked-down; dq 1 =0: a block is not locked-down. 2. erase and program are general terms, respectively, to express: block erase, advanced factory program and (page buffer) program operations. 3. at power-up or device reset, all blocks default to locked state and are not locked-down, that is, [001] (wp#=0) or [101] (wp#=1), regardless of the states before power-off or reset operation. 4. when wp# is driven to v il in [110] state, the state changes to [011] and the blocks are automatically locked. 5. otp (one time program) block has the lock function which is different from those described above. notes: 1. "set lock" means set block lock bit command, "clear lock" means clear block lock bit command and "set lock-down" means set block lock-down bit command. 2. when the set block lock-down bit command is written to the unlocked block (dq 0 =0), the corresponding block is locked-down and automatically locked at the same time. 3. "no change" means that the state remains unchanged after the command written. 4. in this state transitions table, assumes that wp# is not changed and fixed v il or v ih . table 7. functions of block lock (5) and block lock-down current state erase/program allowed (2) state wp# dq 1 (1) dq 0 (1) state name [000] 0 0 0 unlocked yes [001] (3) 0 0 1 locked no [011] 0 1 1 locked-down no [100] 1 0 0 unlocked yes [101] (3) 1 0 1 locked no [110] (4) 1 1 0 lock-down disable yes [111] 1 1 1 lock-down disable no table 8. block locking state transitions upon command write (4) current state result after lock command written (next state) state wp# dq 1 dq 0 set lock (1) clear lock (1) set lock-down (1) [000] 0 0 0 [001] no change [011] (2) [001] 0 0 1 no change (3) [000] [011] [011] 0 1 1 no change no change no change [100] 1 0 0 [101] no change [111] (2) [101] 1 0 1 no change [100] [111] [110] 1 1 0 [111] no change [111] (2) [111] 1 1 1 no change [110] no change rev. 0.11 sharp
lhf64n14 14 notes: 1. "wp#=0 1" means that wp# is driven to v ih and "wp#=1 0" means that wp# is driven to v il . 2. state transition from the current state [011] to the next state depends on the previous state. 3. when wp# is driven to v il in [110] state, the state changes to [011] and the blocks are automatically locked. 4. in this state transitions table, assumes that lock configuration commands are not written in previous, current and next state. table 9. block locking state transitions upon wp# transition (4) previous state current state result after wp# transition (next state) state wp# dq 1 dq 0 wp#=0 1 (1) wp#=1 0 (1) - [000] 0 0 0 [100] - - [001] 0 0 1 [101] - [110] (2) [011] 011 [110] - other than [110] (2) [111] - - [100] 1 0 0 - [000] - [101] 1 0 1 - [001] - [110] 110 - [011] (3) - [111] 1 1 1 - [011] rev. 0.11 sharp
lhf64n14 15 table 10. status register definition rrrrrrrr 15 14 13 12 11 10 9 8 wsms bess bes pbpafpops vpps pbpss dps ppes 76543210 sr.15 - sr.8 = reserved for future enhancements (r) sr.7 = write state machine status (wsms) 1 = ready 0 = busy sr.6 = block erase suspend status (bess) 1 = block erase suspended 0 = block erase in progress/completed sr.5 = block erase status (bes) 1 = error in block erase 0 = successful block erase sr.4 = (page buffer) program, advanced factory program and otp program status (pbpafpops) 1 = error in (page buffer) program, advanced factory program or otp program 0 = successful (page buffer) program, advanced factory program or otp program sr.3 = v pp status (vpps) 1 = v pp low detect, operation abort 0 = v pp ok sr.2 = (page buffer) program suspend status (pbpss) 1 = (page buffer) program suspended 0 = (page buffer) program in progress/completed sr.1 = device protect status (dps) 1 = erase or program attempted on a locked block, operation abort 0 = unlocked sr.0 = partition program and erase status (ppes) 1 = another partition is busy. afp: program or verify busy. 0 = depending on status of sr.7. the addressed partition is busy or no partition is busy. afp: program or verify done, afp ready. notes: status register indicates the status of the partition, not wsm (write state machine). even if the sr.7 is "1", the wsm may be occupied by the other partition when the device is set to 2, 3 or 4 partitions configuration. check sr.7 to determine block erase, advanced factory program, (page buffer) program or otp program completion. sr.6 - sr.1 are invalid while sr.7="0". if both sr.5 and sr.4 are "1"s after a block erase, advanced factory program, (page buffer) program, set/clear block lock bit, set block lock-down bit, set read configuration register, set partition configuration register attempt, an improper command sequence was entered. sr.3 does not provide a continuous indication of v pp level. the wsm interrogates and indicates the v pp level only after block erase, advanced factory program, (page buffer) program or otp program command sequences. sr.3 is not guaranteed to report accurate feedback when v pp v pph1 , v pph2 or v pplk . sr.1 does not provide a continuous indication of block lock bit. the wsm interrogates the block lock bit only after block erase, advanced factory program, (page buffer) program or otp program command sequences. it informs the system, depending on the attempted operation, if the block lock bit is set. reading the block lock configuration codes after writing the read identifier codes/otp command indicates block lock bit status. sr.15 - sr.8 are reserved for future use and should be masked out when polling the status register. if sr.7="0" and sr.0="0", the addressed partition is busy and other partition is not busy. in afp mode, it indicates that the device is finished programming or verifying data or is ready for data. if sr.7="0" and sr.0="1", another partition is busy (the addressed partition is not busy). in afp mode, it indicates that the device is programming or verifying data. if sr.7="1" and sr.0="0", no partition is busy. in afp mode, it indicates that the device has exited afp mode. sr.7="1" and sr.0="1" will not occur. rev. 0.11 sharp
lhf64n14 16 table 11. extended status register definition rrrrrrrr 15 14 13 12 11 10 9 8 smsrrrrrrr 76543210 xsr.15-8 = reserved for future enhancements (r) xsr.7 = state machine status (sms) 1 = page buffer program available 0 = page buffer program not available xsr.6-0 = reserved for future enhancements (r) notes: after issue a page buffer program command (e8h), xsr.7="1" indicates that the entered command is accepted. if xsr.7 is "0", the command is not accepted and a next page buffer program command (e8h) should be issued again to check if page buffer is available or not. xsr.15-8 and xsr.6-0 are reserved for future use and should be masked out when polling the extended status register. rev. 0.11 sharp
lhf64n14 17 table 12. read configuration register definition rm r fc2 fc1 fc0 wt doc wc 15 14 13 12 11 10 9 8 bs cc r r bw bl2 bl1 bl0 76543210 rcr.15 = read mode (rm) 0 = synchronous burst reads enabled 1 = asynchronous reads enabled (default) rcr.14 = reserved for future enhancements (r) rcr.13-11 = frequency configuration (fc2-0) 000 = code 0 reserved for future use 001 = code 1 reserved for future use 010 = code 2 011 = code 3 100 = code 4 101 = code 5 110 = code 6 reserved for future use 111 = code 7 reserved for future use (default) rcr.10 = wait signal polarity (wt) 0 = wait signal is active low 1 = wait signal is active high (default) rcr.9 = data output configuration (doc) 0 = hold data for one clock 1 = hold data for two clocks (default) rcr.8 = wait configuration (wc) 0 = wait asserted during delay 1 = wait asserted one data cycle before delay (default) rcr.7 = burst sequence (bs) 0 = intel burst order 1 = linear burst order (default) rcr.6 = clock configuration (cc) 0 = burst starts and data output on falling clock edge 1 = burst starts and data output on rising clock edge (default) rcr.5-4 = reserved for future enhancements (r) rcr.3 = burst wrap (bw) 0 = wrap burst reads within burst length set by rcr.2-0 1 = no wrap burst reads within burst length set by rcr.2-0 (default). rcr.2-0 = burst length (bl2-0) 001 = 4 word burst 010 = 8 word burst 011 = reserved for future use 111 = continuous (linear) burst (default) notes: read configuration register affects the read operations from main and parameter blocks. read operations for status register, query code, identifier codes, otp block and device configuration codes support single read cycles. rcr.14, rcr.5 and rcr.4 bits are reserved for future use and should be masked out when checking the read configuration register. refer to frequency configuration in table 13 and figure 4 for information about the frequency configuration rcr.13- 11. undocumented combinations of bits rcr.13-11 are reserved for future implementations and should not be used. data is not ready when wait is active. refer to figure 5 for information about data output configuration rcr.9. refer to table 14 for information about burst wrap configuration rcr.3. in the asynchronous page mode, the burst length always equals 8 words. all the bits in the read configuration register are set to "1" after power-up or device reset. when the bit rcr.15 is set to "1", other bits are invalid. rev. 0.11 sharp
lhf64n14 18 clk (c) adv# (v) a 20-0 (a) dq 15-0 (d/q) code 2 code 3 code 4 valid address valid output valid output valid output valid output valid output valid output valid output valid output valid output valid output valid output valid output code 5 valid output valid output dq 15-0 (d/q) dq 15-0 (d/q) dq 15-0 (d/q) a 21-0 (a) table 13. frequency configuration settings read configuration register frequency configuration code input clock frequency (v cc =1.7v-1.95v) rcr.13 rcr.12 rcr.11 70ns 010 2 40mhz 011 3 52mhz 100 4 66mhz 101 5 tbd figure 4. frequency configuration rev. 0.11 sharp
lhf64n14 19 clk (c) 1 clk data hold dq 15-0 (d/q) valid output valid output 2 clk data hold dq 15-0 (d/q) valid output valid output valid output note: 1. the burst wrap bit (rcr.3) determines whether 4- or 8-word burst-accesses wrap within the burst-length boundary or whether they cross word-length boundaries to perform linear accesses. table 14. read sequence and burst length starting address [decimal] burst wrap (1) (rcr.3=) burst addressing sequence [decimal] 4-word burst length (rcr.2-0=001) 8-word burst length (rcr.2-0=010) cotinuous burst (rcr.2-0=111) linear intel linear intel linear 0 0 0-1-2-3 0-1-2-3 0-1-2-3-4-5-6-7 0-1-2-3-4-5-6-7 0-1-2-3-4-5-6? 1 0 1-2-3-0 1-0-3-2 1-2-3-4-5-6-7-0 1-0-3-2-5-4-7-6 1-2-3-4-5-6-7? 2 0 2-3-0-1 2-3-0-1 2-3-4-5-6-7-0-1 2-3-0-1-6-7-4-5 2-3-4-5-6-7-8? 3 0 3-0-1-2 3-2-1-0 3-4-5-6-7-0-1-2 3-2-1-0-7-6-5-4 3-4-5-6-7-8-9? 4 0 4-5-6-7 4-5-6-7 4-5-6-7-0-1-2-3 4-5-6-7-0-1-2-3 4-5-6-7-8-9-10? 5 0 5-6-7-4 5-4-7-6 5-6-7-0-1-2-3-4 5-4-7-6-1-0-3-2 5-6-7-8-9-10-11? 6 0 6-7-4-5 6-7-4-5 6-7-0-1-2-3-4-5 6-7-4-5-2-3-0-1 6-7-8-9-10-11-12? 7 0 7-4-5-6 7-6-5-4 7-0-1-2-3-4-5-6 7-6-5-4-3-2-1-0 7-8-9-10-11-12-13? ... ... ... ... ... ... ... 14 0 14-15-12-13 14-15-12-13 14-15-8-9- 10-11-12-13 14-15-12-13- 10-11-8-9 14-15-16-17-18-19-20? 15 0 15-12-13-14 15-14-13-12 15-8-9-10- 11-12-13-14 15-14-13-12- 11-10-9-8 15-16-17-18-19-20-21? ... ... ... ... ... ... ... 0 1 0-1-2-3 na 0-1-2-3-4-5-6-7 na 0-1-2-3-4-5-6? 1 1 1-2-3-4 na 1-2-3-4-5-6-7-8 na 1-2-3-4-5-6-7? 2 1 2-3-4-5 na 2-3-4-5-6-7-8-9 na 2-3-4-5-6-7-8? 3 1 3-4-5-6 na 3-4-5-6-7-8-9-10 na 3-4-5-6-7-8-9? 4 1 4-5-6-7 na 4-5-6-7-8-9-10-11 na 4-5-6-7-8-9-10? 5 1 5-6-7-8 na 5-6-7-8-9-10-11-12 na 5-6-7-8-9-10-11? 6 1 6-7-8-9 na 6-7-8-9- 10-11-12-13 na 6-7-8-9-10-11-12? 7 1 7-8-9-10 na 7-8-9-10- 11-12-13-14 na 7-8-9-10-11-12-13? ... ... ... ... ... ... ... 14 1 14-15-16-17 na 14-15-16-17- 18-19-20-21 na 14-15-16-17-18-19-20? 15 1 15-16-17-18 na 15-16-17-18- 19-20-21-22 na 15-16-17-18-19-20-21? figure 5. data output configuration rev. 0.11 sharp
lhf64n14 20 plane1 plane0 plane2 plane3 partition1 plane1 plane0 plane2 plane3 partition0 plane1 plane0 plane2 plane3 partition0 plane1 plane0 plane2 plane3 partition0 partition1 partition1 partition0 plane1 plane0 plane2 plane3 partition1 plane1 plane0 plane2 plane3 partition0 plane1 plane0 plane2 plane3 partition0 plane1 plane0 plane2 plane3 partition0 partition1 partition1 partition0 partition2 partition3 partition2 partition2 partition1 partition2 000 001 010 100 011 110 101 111 pc2 pc1pc0 partitioning for dual work partitioning for dual work pc2 pc1pc0 table 15. partition configuration register definition rrrrrpc2pc1pc0 15 14 13 12 11 10 9 8 rrrrrrrr 76543210 pcr.15-11 = reserved for future enhancements (r) pcr.10-8 = partition configuration (pc2-0) 000 = no partitioning. dual work is not allowed. 001 = plane1-3 are merged into one partition. (default in a bottom parameter device) 010 = plane 0-1 and plane2-3 are merged into one partition respectively. 100 = plane 0-2 are merged into one partition. (default in a top parameter device) 011 = plane 2-3 are merged into one partition. there are three partitions in this configuration. dual work operation is available between any two partitions. 110 = plane 0-1 are merged into one partition. there are three partitions in this configuration. dual work operation is available between any two partitions. 101 = plane 1-2 are merged into one partition. there are three partitions in this configuration. dual work operation is available between any two partitions. 111 = there are four partitions in this configuration. each plane corresponds to each partition respec- tively. dual work operation is available between any two partitions. pcr.7-0 = reserved for future enhancements (r) notes: after power-up or device reset, pcr10-8 (pc2-0) is set to "001" in a bottom parameter device and "100" in a top parameter device. see figure 6 for the detail on partition configuration. pcr.15-11 and pcr.7-0 are reserved for future use and should be masked out when checking the partition configuration register. figure 6. partition configuration rev. 0.11 sharp
lhf64n14 21 1 electrical specifications 1.1 absolute maximum ratings * operating temperature during read, erase and program ...-40 c to +85 c (1) storage temperature during under bias............................... -40 c to +85 c during non bias................................ -65 c to +125 c vo l t a g e o n a n y p i n (except v cc and v pp ).............. -0.5v to v cc +0.5v (2) v cc and v ccq supply voltage ........ -0.2v to +2.45v (2) v pp supply voltage .................... -0.2v to +12.6v (2, 3, 4) output short circuit current ........................... 100ma (5) *warning: stressing the device beyond the "absolute maximum ratings" may cause permanent damage. these are stress ratings only. operation beyond the "operating conditions" is not recommended and extended exposure beyond the "operating conditions" may affect device reliability. notes: 1. operating temperature is for extended temperature product defined by this specification. 2. all specified voltages are with respect to gnd. minimum dc voltage is -0.5v on input/output pins and -0.2v on v cc and v pp pins. during transitions, this level may undershoot to -2.0v for periods <20ns. maximum dc voltage on input/output pins is v cc +0.5v which, during transitions, may overshoot to v cc +2.0v for periods <20ns. 3. maximum dc voltage on v pp may overshoot to +13.0v for periods <20ns. 4. v pp erase/program voltage is normally 1.7v-1.95v. applying 11.7v-12.3v to v pp during erase/program can be done for a maximum of 1,000 cycles on the main blocks and 1,000 cycles on the parameter blocks. v pp may be connected to 11.7v-12.3v for a total of 80 hours maximum. 5. output shorted for no more than one second. no more than one output shorted at a time. 1.2 operating conditions notes: 1. see dc characteristics tables for voltage range-specific specification. 2. applying v pp =11.7v-12.3v during a erase or program can be done for a maximum of 1,000 cycles on the main blocks and 1,000 cycles on the parameter blocks. a permanent connection to v pp =11.7v-12.3v is not allowed and can cause damage to the device. parameter symbol min. typ. max. unit notes operating temperature t a -40 +25 +85 c v cc supply voltage v cc 1.7 1.8 1.95 v 1 i/o supply voltage v ccq 1.7 1.8 1.95 v 1 v pp voltage when used as a logic control v pph1 0.90 1.8 1.95 v 1 v pp supply voltage v pph2 11.7 12 12.3 v 1, 2 main block erase cycling: v pp =v pph1 100,000 cycles parameter block erase cycling: v pp =v pph1 100,000 cycles main block erase cycling: v pp =v pph2 , 80 hrs. 1,000 cycles parameter block erase cycling: v pp =v pph2 , 80 hrs. 1,000 cycles maximum v pp hours at v pph2 80 hours rev. 0.11 sharp
lhf64n14 22 test points v ccq /2 v ccq /2 input v ccq 0.0 output ac test inputs are driven at v ccq (min) for a logic "1" and 0.0v for a logic "0". input timing begins, and output timing ends at v ccq /2. input rise and fall times (10% to 90%) < 5ns. worst case speed conditions are when v cc =v cc (min).     
 
    
   ! "   figure 7. transient input/output reference waveform for v cc =1.7v-1.95v figure 8. transient equivalent testing load circuit table 16. configuration capacitance loading value test configuration c l (pf) v cc =1.7v-1.95v 50 1.2.2 ac input/output conditions 1.2.1 capacitance (1) (t a = + 25 c, f=1mhz) note: 1. sampled, not 100% tested. parameter symbol condition min. typ. max. unit input capacitance c in v in =0.0v 68pf ce# input capacitance c ce v in =0.0v 10 12 pf output capacitance c out v out =0.0v 10 12 pf rev. 0.11 sharp
lhf64n14 23 1.2.3 dc characteristics v cc =1.7v-1.95v symbol parameter notes min. typ. max. unit test conditions i li input load current 1 -1.0 +1.0 a v cc =v cc max., v ccq =v ccq max., v in /v out =v ccq or gnd i lo output leakage current 1 -1.0 +1.0 a i ccs v cc standby current 1420 a v cc =v cc max., ce#=rst#= v ccq 0.2v, wp#, adv#= v ccq or gnd i ccas v cc automatic power savings current 1,5 4 20 a v cc =v cc max., ce#=gnd0.2v, wp#, adv#= v ccq or gnd i ccd v cc reset power-down current 1420 a rst#=gnd0.2v i ccr average v cc read current normal mode 1,7 15 25 ma v cc =v cc max., ce#=v il , oe#=v ih , f=5mhz average v cc read current page mode 8 word read 1,7 5 10 ma average v cc read current synchronous clk=52mhz burst length=4 1,3,8 15 20 ma v cc =v cc max., ce#=v il , oe#=v ih , f=52mhz burst length=8 1,3,8 15 20 ma burst length= continuous 1,3,8 25 30 ma average v cc read current synchronous clk=66mhz burst length=4 1,3,8 20 25 ma v cc =v cc max., ce#=v il , oe#=v ih , f=66mhz burst length=8 1,3,8 20 25 ma burst length= continuous 1,3,8 32 38 ma i ccw v cc (page buffer) program, advanced factory program current 1,6,8 20 60 ma v pp =v pph1 1,6,8 10 20 ma v pp =v pph2 i cce v cc block erase current 1,6,8 10 30 ma v pp =v pph1 1,6,8 4 10 ma v pp =v pph2 i ccws i cces v cc (page buffer) program or block erase suspend current 1,2,8 10 200 a ce#=v ih i pps i ppr v pp standby or read current 1,7,8 2 5 a v pp v cc i ppw v pp (page buffer) program, advanced factory program current 1,6,7,8 2 5 a v pp =v pph1 1,6,7,8 10 30 ma v pp =v pph2 i ppe v pp block erase current 1,6,7,8 2 5 a v pp =v pph1 1,6,7,8 5 15 ma v pp =v pph2 rev. 0.11 sharp
lhf64n14 24 notes: 1. all currents are in rms unless otherwise noted. typical values are the reference values at v cc =1.8v and t a =+25 c unless v cc is specified. 2. i ccws and i cces are specified with the device de-selected. if read or (page buffer) program is executed while in block erase suspend mode, the device?s current draw is the sum of i cces and i ccr or i ccw . if read is executed while in (page buffer) program suspend mode, the device?s current draw is the sum of i ccws and i ccr . 3. the burst wrap bit (rcr.3) determines whether 4- or 8-word burst-accesses wrap within the burst-length boundary or whether they cross word-length boundaries to perform linear accesses. 4. block erase, advanced factory program, (page buffer) program and otp program are inhibited when v pp v pplk , and not guaranteed in the range between v pplk (max.) and v pph1 (min.), between v pph1 (max.) and v pph2 (min.) and above v pph2 (max.). 5. the automatic power savings (aps) feature automatically places the device in power save mode after read cycle completion. standard address access timings (t avqv ) provide new data when addresses are changed. 6. sampled, not 100% tested. 7. v pp is not used for power supply pin. with v pp v pplk , block erase, advanced factory program, (page buffer) program and otp program cannot be executed and should not be attempted. applying 12v0.3v to v pp provides fast erasing or fast programming mode. in this mode, v pp is power supply pin and supplies the memory cell current for block erasing and (page buffer) programming. use similar power supply trace widths and layout considerations given to the v cc power bus. applying 12v0.3v to v pp during erase/program can only be done for a maximum of 1,000 cycles on each block. v pp may be connected to 12v0.3v for a total of 80 hours maximum. 8. the operating current in dual work is the sum of the operating current (read, erase, program) in each plane. i ppws v pp (page buffer) program suspend current 1,7,8 2 5 a v pp =v pph1 1,7,8 10 200 a v pp =v pph2 i ppes v pp block erase suspend current 1,7,8 2 5 a v pp =v pph1 1,7,8 10 200 a v pp =v pph2 v il input low voltage 6 -0.4 0.4 v v ih input high voltage 6 v ccq -0.4 v ccq + 0.4 v v ol output low voltage 6 0.1 v v cc =v cc min., v ccq =v ccq min., i ol =100 a v oh output high voltage 6 v ccq -0.1 v v cc =v cc min., v ccq =v ccq min., i oh =-100a v pplk v pp lockout during normal operations 4,6,7 0.4 v v pph1 v pp during block erase, (page buffer) program or otp program operations 7 0.9 1.8 1.95 v v pph2 v pp during block erase, advanced factory program, (page buffer) program or otp program operations 7 11.7 12 12.3 v v lko v cc lockout voltage 1.0 v v cc =1.7v-1.95v symbol parameter notes min. typ. max. unit test conditions dc characteristics (continued) rev. 0.11 sharp
lhf64n14 25 1.2.4 ac characteristics - read-only operations (1) notes: 1. see ac input/output reference waveform for timing measurements and maximum allowable input slew rate. 2. sampled, not 100% tested. 3. applies only to subsequent synchronous reads. 4. oe# may be delayed up to t elqv ? t glqv after the falling edge of ce# without impact to t elqv . v cc =1.7v-1.95v, t a =-40 c to +85 c symbol parameter notes min. max. unit t clk clk period 15 ns t ch (t cl ) clk high (low) time 5 ns t chcl (t clch ) clk fall (rise) time 2.5 ns t av c h address setup to clk 9 ns t vlch adv# setup to clk 10 ns t elch ce# setup to clk 9 ns t chqv clk to output delay 14 ns t chqx output hold from clk 3 ns t chax address hold from clk 10 ns t chtv clk to wait valid 14 ns t eltv ce# low to wait valid 14 ns t ehtz ce# high to wait high z 20 ns t ehel ce# high between subsequent synchronous reads 3 15 ns t avvh address setup to adv# 10 ns t elvh ce# setup to adv# 10 ns t avav read cycle time 70 ns t avqv address to output delay 70 ns t elqv ce# to output delay 4 70 ns t vlqv adv# to output delay 70 ns t vlvh adv# pulse width low 10 ns t vhvl adv# pulse width high 10 ns t vhax address hold from adv# 9 ns t apa page address access time 20 ns t glqv oe# to output delay 4 20 ns t phqv rst# high to output delay 150 ns t ehqz , t ghqz ce# or oe# to output in high z, whichever occurs first 2 15 ns t elqx ce# to output in low z 2 0 ns t glqx oe# to output in low z 2 0 ns t oh output hold from first occurring address, ce# or oe# change 2 0 ns rev. 0.11 sharp
lhf64n14 26 clk (c) t clk t cl t chcl t clch t ch t avqv t avvh t vlvh t vhvl t ehqz t ghqz t vhax t vlqv t elqv t phqv t elvh t glqv t oh v ih v il v ih v il v ih v il v ih v il v ih v il v oh v ol v oh v ol v ih v il (p) (d/q) (t) (w) (g) (e) (v) (a) a 20-0 dq 15-0 adv# ce# oe# wait we# rst# valid address valid output high z t elqx t glqx high z note 1 high z t avav note: 1. wait shown active low. a 21-0 (a) figure 9. ac waveform for clk input figure 10. ac waveform for single asynchronous read operations from status register, identifier codes, otp block or query code rev. 0.11 sharp
lhf64n14 27 valid address valid address valid address valid address valid output valid output valid output valid output t avqv t vlvh t vhvl t vlqv t elqv t elvh t vhax t ehqz t ghqz t oh t apa t phqv high z t avvh v ih v il v ih v il v ih v il v ih v il v ih v il v oh v ol v ih v il (p) (d/q) (w) (g) (e) (v) (a) a 20-3 v ih v il (a) a 2-0 dq 15-0 adv# ce# oe# we# (t) wait rst# valid address t glqv t elqx t glqx v oh v ol high z note 1 high z t avav note: 1. wait shown active low. a 21-3 (a) figure 11. ac waveform for asynchronous 4-word page mode read operations from main blocks or parameter blocks rev. 0.11 sharp
lhf64n14 28 figure 12. ac waveform for asynchronous 8-word page mode read operations from main blocks or parameter blocks valid address t avqv t vlvh t vhvl t vlqv t elqv t elvh t vhax t ehqz t ghqz t oh t apa t phqv t avvh v ih v il v ih v il v ih v il v ih v il v ih v il v oh v ol v ih v il (p) (d/q) (w) (g) (e) (v) (a) a 20-3 (a) a 2-0 dq 15-0 adv# ce# oe# we# (t) wait rst# t glqv t elqx t glqx v oh v ol high z note 1 high z t avav v ih v il valid address valid address valid address valid address valid address valid address valid address valid address high z valid output valid output valid output valid output valid output valid output valid output valid output note: 1. wait shown active low. a 21-3 (a) rev. 0.11 sharp
lhf64n14 29 v ih v il valid output valid address t avvh t avch t chax t vhax t avqv t vlvh t vlch t vlqv t chqv t ghqz t ehqz t elvh t elch t elqv t oh t chqx t vhvl high z note 1 v ih v il v ih v il v ih v il v ih v il v oh v ol (d/q) (w) (g) (e) (v) (a) a 20-0 v ih v il (c) clk dq 15-0 adv# ce# oe# we# t glqv t elqx t glqx note: 1. depending upon the frequency configuration code in the read configuration register, insert clock cycles: frequency configuration code 2, insert two clock cycles frequency configuration code 3, insert three clock cycles frequency configuration code 4, insert four clock cycles frequency configuration code 5, insert five clock cycles 2. wait (shown active low) configuration allows assertion one clk cycle before or during an output delay. v oh v ol (t) wait high z note 2 high z t eltv t chtv t ehtz figure 13. ac waveform for single synchronous read operations from status register, identifier codes, otp block or query code a 21-0 (a) rev. 0.11 sharp
lhf64n14 30 v ih v il valid address t avvh t avch t chax t vhax t avqv t vlvh t vlch t vlqv t ghqz t ehqz t elvh t elch t elqv t oh t chqx t chqv t vhvl high z note 1 v ih v il v ih v il v ih v il v ih v il v oh v ol (d/q) (w) (g) (e) (v) (a) a 20-0 v ih v il (c) clk dq 15-0 adv# ce# oe# we# valid output valid output valid output valid output t elqx t glqx note: 1. depending upon the frequency configuration code in the read configuration register, insert clock cycles: frequency configuration code 2, insert two clock cycles frequency configuration code 3, insert three clock cycles frequency configuration code 4, insert four clock cycles frequency configuration code 5, insert five clock cycles 2. wait (shown active low) configuration allows assertion one clk cycle before or during an output delay. t glqv v oh v ol (t) wait high z note 2 high z t eltv t chtv t ehtz figure 14. ac waveform for synchronous burst mode read operations from main blocks or parameter blocks (4 word burst: rcr.2-0=001) a 21-0 (a) rev. 0.11 sharp
lhf64n14 31 v ih v il valid address t avvh t avch t chax t vh ax t avqv t vlvh t vlch t vlqv t elvh t elch t elqv t vhvl v ih v il v ih v il v ih v il v ih v il (w) (g) (e) (v) (a) a 20-0 v ih v il (c) clk adv# ce# oe# we# note: 1. wait (shown active low) configuration allows assertion one clk cycle before or during an output delay. v oh v ol (d/q) dq 15-0 high z v oh v ol (d/q) dq 15-0 high z valid output valid output valid output valid output v oh v ol (d/q) dq 15-0 high z v oh v ol (t) wait high z note 1 t eltv v oh v ol (t) wait high z note 1 t eltv t chtv v oh v ol (t) wait high z note 1 t eltv t chtv t chtv invalid output invalid output invalid output invalid output invalid output invalid output t chtv t chtv t chqv t chqx t elqx t glqx t gl qv valid output valid output valid output valid output valid output valid output valid output valid output invalid output invalid output t chqv t chqx valid output valid output valid output valid output valid output valid output valid output valid output valid output valid output t chqv t chqx 4 word burst: rcr.2-0 = 001 8 word burst: rcr.2-0 = 010 continuous burst: rcr.2-0 = 111 figure 15. ac waveform for synchronous burst mode read operations from main blocks or parameter blocks (frequency configuration: rcr.13-11=010) a 21-0 (a) rev. 0.11 sharp
lhf64n14 32 valid output invalid output note 2 note 1 valid output valid output v ih v il v ih v il v ih v il v ih v il v ih v il v oh v ol (d/q) (w) (g) (e) (v) (a) a 20-0 v ih v il (c) clk dq 15-0 adv# ce# oe# we# v oh v ol (t) wait t chtv t chqx t chqv t chqx notes: 1. this delay occurs only in continuous burst mode or 4-, 8-word burst with no-wrap mode. 2. wait (shown active low) configuration allows assertion one clk cycle before or during an output delay. figure 16. ac waveform for an output delay when continuous burst read with data output configurations set to one clock a 21-0 (a) rev. 0.11 sharp
lhf64n14 33 1.2.5 ac characteristics - write operations (1), (2) notes: 1. the timing characteristics for reading the status register during block erase, advanced factory program, (page buffer) program and otp program operations are the same as during read-only operations. refer to ac characteristics for read- only operations. 2. a write operation can be initiated and terminated with either ce# or we#. 3. sampled, not 100% tested. 4. write pulse width (t wp ) is defined from the falling edge of ce# or we# (whichever goes low last) to the rising edge of ce# or we# (whichever goes high first). hence, t wp =t wlwh =t eleh =t wleh =t elwh . 5. write pulse width high (t wph ) is defined from the rising edge of ce# or we# (whichever goes high first) to the falling edge of ce# or we# (whichever goes low last). hence, t wph =t whwl =t ehel =t whel =t ehwl . 6. v pp should be held at v pp =v pph1/2 until determination of block erase, (page buffer) program or otp program success (sr.1/3/4/5=0) and held at v pp =v pph2 until determination of advanced factory program success (sr.0/1/3/4=0). 7. t whr0 (t ehr0 ) after the read query or read identifier codes/otp command=t avqv +100ns. 8. refer to table 6 for valid address and data for block erase, advanced factory program, (page buffer) program, otp program or lock bit configuration. v cc =1.7v-1.95v, t a =-40 c to +85 c symbol parameter notes min. max. unit t avav write cycle time 70 ns t phwl (t phel ) rst# high recovery to we# ( ce# ) going low 3150 ns t elwl (t wlel ) ce# (we#) setup to we# (ce#) going low 0 ns t wlwh (t eleh ) we# (ce#) pulse width 4 45 ns t vlvh adv# pulse width 10 ns t dvwh (t dveh ) data setup to we# (ce#) going high 8 45 ns t av w h (t av e h ) address setup to we# (ce#) going high 8 45 ns t vlwh (t vleh ) adv# setup to we# (ce#) going high 45 ns t avvh address setup to adv# going high 10 ns t wheh (t ehwh ) ce# (we#) hold from we# (ce#) high 0 ns t whdx (t ehdx ) data hold from we# (ce#) high 0 ns t whax (t ehax ) address hold from we# (ce#) high 0 ns t vhax address hold from adv# high 9 ns t whwl (t ehel ) we# (ce#) pulse width high 5 25 ns t shwh (t sheh ) wp# high setup to we# (ce#) going high 3 0 ns t vvwh (t vveh )v pp setup to we# (ce#) going high 3200 ns t whgl (t ehgl ) write recovery before read 30 ns t qvsl wp# high hold from valid srd 3, 6 0 ns t qvvl v pp hold from valid srd 3, 6 0 ns t whr0 (t ehr0 ) we# (ce#) high to sr.7 going "0" 3, 7 t avqv + 19 ns rev. 0.11 sharp
lhf64n14 34 valid address valid address valid address data in data in valid srd t avvh t vhvl t vlvh t vhax t avwh (t aveh ) t vlwh (t vleh ) t whax (t ehax ) t elwl (t wlel ) t phwl (t phel ) t wlwh t whwl (t ehel ) t whdx (t ehdx ) t dvwh (t dveh ) t shwh (t sheh ) t vvwh (t vveh ) t whqv1,2,3 (t ehqv1,2,3 ) t qvsl t qvvl t wheh (t ehwh )t whgl (t ehgl ) v ih v il v ih v il v ih v il v ih v il v ih v il v ih v il (d/q) (w) (g) (e) (v) (a) note 1 note 2 note 3 notes 5, 6 note 4 note 6 note 5 a 20-0 dq 15-0 (v) v pp v ih v pph1,2 v pplk v il v il (p) rst# adv# ce# oe# we# v ih v il (s) wp# notes: 1. v cc power-up and standby. 2. write each first cycle command. 3. write each second cycle command or valid address and data. 4. automated erase or program delay. 5. read status register data. 6. for read operation, oe#, ce# and adv# must be driven active, and we# de-asserted. (t eleh ) "1" "0" (r) sr.7 t whr0 (t ehr0 ) t avav notes 5, 6 figure 17. ac waveform for write operations a 21-0 (a) rev. 0.11 sharp
lhf64n14 35 abort complete t plph t plph t 2vph t plrh t phqv t phqv (a) reset during read array mode (b) reset during erase or program mode (c) rst# rising timing rst# rst# v il v ih v il v ih v cc gnd v cc (min) rst# v il v ih sr.7="1" v oh v ol (d/q) dq 15-0 valid output high z (p) (p) (p) v oh v ol (d/q) dq 15-0 valid output high z v oh v ol (d/q) dq 15-0 valid output high z t phqv t vhqv notes: 1. a reset time, t phqv , is required from the later of sr.7 going "1" or rst# going high until outputs are valid. refer to ac characteristics - read-only operations for t phqv . 2. t plph is <100ns the device may still reset but this is not guaranteed. 3. sampled, not 100% tested. 4. if rst# asserted while a block erase, advanced factory program, (page buffer) program or otp program operation is not executing, the reset will complete within 100ns. 5. when the device power-up, holding rst# low minimum 100ns is required after v cc has been in predefined range and also has been in stable there. reset ac specifications (v cc =1.7v-1.95v, t a =-40 c to +85 c) symbol parameter notes min. max. unit t plph rst# low to reset during read (rst# should be low during power-up.) 1, 2, 3 100 ns t plrh rst# low to reset during erase or program 1, 3, 4 20 s t 2vph v cc 1.7v to rst# high 1, 3, 5 100 ns t vhqv v cc 1.7v to output delay 31ms figure 18. ac waveform for reset operations 1.2.6 reset operations rev. 0.11 sharp
lhf64n14 36 1.2.7 block erase, advanced factory program, (page buffer) program and otp program performance (3) notes: 1. typical values measured at v cc =1.8v, v pp =1.8v or 12v, and t a =+25 c. assumes corresponding lock bits are not set. subject to change based on device characterization. 2. excludes external system-level overhead. 3. sampled, but not 100% tested. 4. a latency time is required from writing suspend command (we# or ce# going high) until sr.7 going "1". 5. if the interval time from a block erase resume command to a subsequent block erase suspend command is shorter than t eres and its sequence is repeated, the block erase operation may not be finished. 6. afp mode is allowed only when t a =+20 c to +30 c. 7. in afp mode, eight 4k-word parameter blocks are programmed at a time. specification shown above is the program time per each 4k-word parameter block. v cc =1.7v-1.95v, t a =-40 c to +85 c symbol parameter notes pbp (page buffer) is used, afp (advanced factory program) is used or not v pp =v pph1 (in system) v pp =v pph2 (in manufacturing) unit min. typ. (1) max. (2) min. typ. (1) max. (2) t wpb 4k-word parameter block program time 2 - 0.09 0.23 0.04 0.07 s 2 pbp 0.05 0.2 0.02 0.06 s 2, 6, 7 afp - - 0.015 - s t wmb 32k-word main block program time 2 - 0.72 1.8 0.31 0.6 s 2 pbp 0.34 1.4 0.17 0.5 s 2, 6 afp - - 0.12 - s t whqv1 / t ehqv1 word program time 2 - 22 150 9 130 s 2 pbp 10 100 5 90 s 2, 6 afp - - 3.5 16 s t whov1 / t ehov1 otp program time 2 - 72 800 27 185 s t whqv2 / t ehqv2 4k-word parameter block erase time 2 - 0.3 2.5 0.2 2.5 s t whqv3 / t ehqv3 32k-word main block erase time 2 - 0.6 4 0.5 4 s t whrh1 / t ehrh1 (page buffer) program suspend latency time to read 4- 510 510 s t whrh2 / t ehrh2 block erase suspend latency time to read 4- 520 520 s t eres latency time from block erase resume command to block erase suspend command 5 - 500 500 s t ares latency time for afp set-up 2, 6 afp - - - 5 s latency for afp verify transition 2, 6 afp - - 2.7 5.6 s latency for afp verify 2, 6 afp - - 1.7 130 s rev. 0.11 sharp
rev. 1.10 i a-1 recommended operating conditions a-1.1 at device power-up ac timing illustrated in figure a-1 is recommended for the supply voltages and the control signals at device power-up. if the timing in the figure is ignored, the device may not operate correctly. figure a-1. ac timing at device power-up for the ac specifications t vr , t r , t f in the figure, refer to the next page. see the ?electrical specifications? described in specifications for the supply voltage range, the operating temperature and the ac specifications not shown in the next page. t 2vph gnd v cc (min) rst# v il v ih (p) t phqv v pp *1 gnd v ccwh1/2 (v) ce# v il v ih (e) we# v il v ih (w) oe# v il v ih (g) wp# v il v ih (s) v oh v ol (d/q) data high z valid output t vr t f t elqv t f t glqv (a) address valid (rp#) (v ccw ) t r or t f address v il v ih t avqv t r or t f t r t r *1 to prevent the unwanted writes, system designers should consider the design, which applies v pp (v ccw ) to 0v during read operations and v pph1/2 (v ccwh1/2 ) during write or erase operations. (v pph1/2 ) see the application note ap-007-sw-e for details. v cc v ccq adv# v il v ih (v) t f t vlqv t r sharp
rev. 1.10 ii a-1.1.1 rise and fall time notes: 1. sampled, not 100% tested. 2. this specification is applied for not only the device power-up but also the normal operations. symbol parameter notes min. max. unit t vr v cc rise time 1 0.5 30000 s/v t r input signal rise time 1, 2 1 s/v t f input signal fall time 1, 2 1 s/v sharp
rev. 1.10 iii a-1.2 glitch noises do not input the glitch noises which are below v ih (min.) or above v il (max.) on address, data, reset, and control signals, as shown in figure a-2 (b). the acceptable glitch noises are illustrated in figure a-2 (a). figure a-2. waveform for glitch noises see the ?dc characteristics? describ ed in specifications for v ih (min.) and v il (max.). (a) acceptable glitch noises input signal v ih (min.) input signal v ih (min.) input signal v il (max.) input signal v il (max.) (b) not acceptable glitch noises sharp
rev. 1.10 iv a-2 related document information (1) note: 1. international customers should contact their local sharp or distribution sales office. document no. document name ap-001-sd-e flash memory family software drivers ap-006-pt-e data protection method of sharp flash memory ap-007-sw-e rp#, v pp electric potential switching circuit sharp

s p e c i f i c a t i o n s a r e s u b j e c t t o c h a n g e w i t h o u t n o t i c e . s u g g e s t e d a p p l i c a t i o n s ( i f a n y ) a r e f o r s t a n d a r d u s e ; s e e i m p o r t a n t r e s t r i c t i o n s f o r l i m i t a t i o n s o n s p e c i a l a p p l i c a t i o n s . s e e l i m i t e d  w a r r a n t y f o r s h a r p ? s p r o d u c t w a r r a n t y . t h e l i m i t e d w a r r a n t y i s i n l i e u , a n d e x c l u s i v e o f , a l l o t h e r w a r r a n t i e s , e x p r e s s o r i m p l i e d .  a l l e x p r e s s a n d i m p l i e d w a r r a n t i e s , i n c l u d i n g t h e w a r r a n t i e s o f m e r c h a n t a b i l i t y , f i t n e s s f o r u s e a n d  f i t n e s s f o r a p a r t i c u l a r p u r p o s e , a r e s p e c i f i c a l l y e x c l u d e d . i n n o e v e n t w i l l s h a r p b e l i a b l e , o r i n a n y w a y r e s p o n s i b l e ,  f o r a n y i n c i d e n t a l o r c o n s e q u e n t i a l e c o n o m i c o r p r o p e r t y d a m a g e . n o r t h a m e r i c a e u r o p e j a p a n s h a r p m i c r o e l e c t r o n i c s o f t h e a m e r i c a s 5 7 0 0 n w p a c i f i c r i m b l v d . c a m a s , w a 9 8 6 0 7 , u . s . a . p h o n e : ( 1 ) 3 6 0 - 8 3 4 - 2 5 0 0 f a x : ( 1 ) 3 6 0 - 8 3 4 - 8 9 0 3 f a s t i n f o : ( 1 ) 8 0 0 - 8 3 3 - 9 4 3 7 w w w . s h a r p s m a . c o m s h a r p m i c r o e l e c t r o n i c s e u r o p e d i v i s i o n o f s h a r p e l e c t r o n i c s ( e u r o p e ) g m b h s o n n i n s t r a s s e 3 2 0 0 9 7 h a m b u r g , g e r m a n y p h o n e : ( 4 9 ) 4 0 - 2 3 7 6 - 2 2 8 6 f a x : ( 4 9 ) 4 0 - 2 3 7 6 - 2 2 3 2 w w w . s h a r p s m e . c o m s h a r p c o r p o r a t i o n e l e c t r o n i c c o m p o n e n t s & d e v i c e s 2 2 - 2 2 n a g a i k e - c h o , a b e n o - k u o s a k a 5 4 5 - 8 5 2 2 , j a p a n p h o n e : ( 8 1 ) 6 - 6 6 2 1 - 1 2 2 1 f a x : ( 8 1 ) 6 1 1 7 - 7 2 5 3 0 0 / 6 1 1 7 - 7 2 5 3 0 1 w w w . s h a r p - w o r l d . c o m t a i w a n s i n g a p o r e k o r e a s h a r p e l e c t r o n i c c o m p o n e n t s ( t a i w a n ) c o r p o r a t i o n 8 f - a , n o . 1 6 , s e c . 4 , n a n k i n g e . r d . t a i p e i , t a i w a n , r e p u b l i c o f c h i n a p h o n e : ( 8 8 6 ) 2 - 2 5 7 7 - 7 3 4 1 f a x : ( 8 8 6 ) 2 - 2 5 7 7 - 7 3 2 6 / 2 - 2 5 7 7 - 7 3 2 8 s h a r p e l e c t r o n i c s ( s i n g a p o r e ) p t e . , l t d . 4 3 8 a , a l e x a n d r a r o a d , # 0 5 - 0 1 / 0 2 a l e x a n d r a t e c h n o p a r k , s i n g a p o r e 1 1 9 9 6 7 p h o n e : ( 6 5 ) 2 7 1 - 3 5 6 6 f a x : ( 6 5 ) 2 7 1 - 3 8 5 5 s h a r p e l e c t r o n i c c o m p o n e n t s ( k o r e a ) c o r p o r a t i o n r m 5 0 1 g e o s u n g b / d , 5 4 1 d o h w a - d o n g , m a p o - k u s e o u l 1 2 1 - 7 0 1 , k o r e a p h o n e : ( 8 2 ) 2 - 7 1 1 - 5 8 1 3 ~ 8 f a x : ( 8 2 ) 2 - 7 1 1 - 5 8 1 9 c h i n a h o n g k o n g s h a r p m i c r o e l e c t r o n i c s o f c h i n a ( s h a n g h a i ) c o . , l t d . 2 8 x i n j i n q i a o r o a d k i n g t o w e r 1 6 f p u d o n g s h a n g h a i , 2 0 1 2 0 6 p . r . c h i n a p h o n e : ( 8 6 ) 2 1 - 5 8 5 4 - 7 7 1 0 / 2 1 - 5 8 3 4 - 6 0 5 6 f a x : ( 8 6 ) 2 1 - 5 8 5 4 - 4 3 4 0 / 2 1 - 5 8 3 4 - 6 0 5 7 h e a d o f f i c e : n o . 3 6 0 , b a s h e n r o a d , x i n d e v e l o p m e n t b l d g . 2 2 w a i g a o q i a o f r e e t r a d e z o n e s h a n g h a i 2 0 0 1 3 1 p . r . c h i n a e m a i l : s m c @ c h i n a . g l o b a l . s h a r p . c o . j p s h a r p - r o x y ( h o n g k o n g ) l t d . 3 r d b u s i n e s s d i v i s i o n , 1 7 / f , a d m i r a l t y c e n t r e , t o w e r 1 1 8 h a r c o u r t r o a d , h o n g k o n g p h o n e : ( 8 5 2 ) 2 8 2 2 9 3 1 1 f a x : ( 8 5 2 ) 2 8 6 6 0 7 7 9 w w w . s h a r p . c o m . h k s h e n z h e n r e p r e s e n t a t i v e o f f i c e : r o o m 1 3 b 1 , t o w e r c , e l e c t r o n i c s s c i e n c e & t e c h n o l o g y b u i l d i n g s h e n n a n z h o n g r o a d s h e n z h e n , p . r . c h i n a p h o n e : ( 8 6 ) 7 5 5 - 3 2 7 3 7 3 1 f a x : ( 8 6 ) 7 5 5 - 3 2 7 3 7 3 5


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